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Strengthening brittle semiconductor nanowires through stacking faults: Insights from in situ mechanical testing

Chen, Bin; Wang, Jun; Gao, Qiang; Chen, Yujie; Liao, Xiao-Zhou; Lu, Chunsheng; Tan, Hoe Hark; Mai, Yiu-Wing; Zou, Jin; Ringer, Simon P.; Gao, Hua-Jian; Jagadish, Chennupati

Description

Quantitative mechanical testing of single-crystal GaAs nanowires was conducted using in situ deformation transmission electron microscopy. Both zinc-blende and wurtzite structured GaAs nanowires showed essentially elastic deformation until bending failure

CollectionsANU Research Publications
Date published: 2013
Type: Journal article
URI: http://hdl.handle.net/1885/74822
Source: Nano Letters
DOI: 10.1021/nl402180k

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