Strengthening brittle semiconductor nanowires through stacking faults: Insights from in situ mechanical testing
Quantitative mechanical testing of single-crystal GaAs nanowires was conducted using in situ deformation transmission electron microscopy. Both zinc-blende and wurtzite structured GaAs nanowires showed essentially elastic deformation until bending failure
|Collections||ANU Research Publications|
|01_Chen_Strengthening_brittle_2013.pdf||3.14 MB||Adobe PDF||Request a copy|
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.