Strengthening brittle semiconductor nanowires through stacking faults: Insights from in situ mechanical testing
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Chen, Bin; Wang, Jun; Gao, Qiang; Chen, Yujie; Liao, Xiao-Zhou; Lu, Chunsheng; Mai, Yiu-Wing; Zou, Jin; Ringer, Simon P.; Gao, Hua-Jian; Jagadish, Chennupati; Tan, Hark Hoe
Description
Quantitative mechanical testing of single-crystal GaAs nanowires was conducted using in situ deformation transmission electron microscopy. Both zinc-blende and wurtzite structured GaAs nanowires showed essentially elastic deformation until bending failure
| Collections | ANU Research Publications |
|---|---|
| Date published: | 2013 |
| Type: | Journal article |
| URI: | http://hdl.handle.net/1885/74822 |
| Source: | Nano Letters |
| DOI: | 10.1021/nl402180k |
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| File | Description | Size | Format | Image |
|---|---|---|---|---|
| 01_Chen_Strengthening_brittle_2013.pdf | 3.14 MB | Adobe PDF | Request a copy |
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