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Lift-off protocols for thin films for use in EXAFS experiments

Decoster, Stefan; Glover, C J; Johannessen, B; Giulian, R; Sprouster, David; Kluth, Patrick; Araujo, L L; Hussain, Z S; Schnohr, Claudia; Salama, Hazar; Kremer, Felipe; Temst, K.; Vantomme, A; Ridgway, Mark C


Lift-off protocols for thin films for improved extended X-ray absorption fine structure (EXAFS) measurements are presented. Using wet chemical etching of the substrate or the interlayer between the thin film and the substrate, stand-alone high-quality mic

CollectionsANU Research Publications
Date published: 2013
Type: Journal article
Source: Journal of Synchrotron Radiation
DOI: 10.1107/S0909049513005049


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