GISAXS Studies of Structural Modifications in Ion-beam Amorphized Ge
Grazing incidence small angle scattering of X-rays (GISAXS) was used to analyze structural modifications in implantation-damaged Ge. Samples were implanted by different doses of 74Ge, from 3 × 1012 cm-2 to 3 × 1016 cm-2; at room- or liquid nitrogen-temp
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|Source:||Nuclear Instruments and Methods in Physics Research: Section B|
|01_Desnica-Frankovic_GISAXS_Studies_of_Structural_2006.pdf||939.83 kB||Adobe PDF||Request a copy|
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