Raman, Harsh; Ryan, P.R.; Raman, R.; Stodart, B.J.; Zhang, Kerong; Martin, P.; Wood, R.; Sasaki, T.; Yamamoto, Yoko; Mackay, M.; Hebb, Diane M; Delhazie , E.
Allele diversities of four markers specific to intron three, exon four and promoter regions of the aluminum (Al) resistance gene of wheat (Triticum aestivum L.) TaALMT1 were compared in 179 common wheat cultivars used in international wheat breeding programs. In wheat cultivars released during the last 93 years, six different promoter types were identified on the basis of allele size. A previous study showed that Al resistance was not associated with a particular coding allele for TaALMT1 but...[Show more]
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