Oblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials
Oates, T W H; Dastmalchi, B; Isic, G; Tollabimazraehno, S; Helgert, Christian; Pertsch, Thomas; Kley, E.-B.; Verschuuren, M A; Bergmair, I; Hingerl, K; Hinrichs, K
We use spectroscopic ellipsometry to investigate the angular-dependent optical modes of fishnet metamaterials fabricated by nanoimprint lithography. Spectroscopic ellipsometry is demonstrated as a fast and efficient method for metamaterial characterization and the measured polarization ratios significantly simplify the calibration procedures compared to reflectance and transmittance measurements. We show that the modes can be well identified by a combination of comparing different substrates...[Show more]
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