Mapping optical process in semiconductor nanowires using dynamic optical tweezers
We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductor nanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of a spatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source and collection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enables different sections of the...[Show more]
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|Source:||Proceedings of SPIE - The International Society for Optical Engineering|
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