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Structural evolution of Ge 2 Sb 2 Te 5 films under the 488 nm laser irradiation

Fu, Jing; Shen, Xiang; Xu, Yinsheng; Wang, Guoxiang; Nie, Qiuhua; Lin, Changgui; Dai, Shixun; Xu, Tiefeng; Wang, Rongping

Description

Ge 2Sb 2Te 5 films were locally crystallized by a tightly focused laser beam and the structural evolution was studied by Raman scatting. The marks recorded by a broad range of laser power were studied by optical microscope. Raman spectra of films with irradiation power of 0.1 mW and 1 mW were consistent with those of films annealed at 140°C and 400°C, respectively. It reveals that both the cubic and hexagonal crystalline phases have been achieved under the irradiation of 488 nm laser in...[Show more]

CollectionsANU Research Publications
Date published: 2012
Type: Journal article
URI: http://hdl.handle.net/1885/71044
Source: Materials Letters
DOI: 10.1016/j.matlet.2012.08.051

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