Structural evolution of Ge 2 Sb 2 Te 5 films under the 488 nm laser irradiation
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Fu, Jing; Shen, Xiang; Xu, Yinsheng; Wang, Guoxiang; Nie, Qiuhua; Lin, Changgui; Dai, Shixun; Xu, Tiefeng; Wang, Rongping
Description
Ge 2Sb 2Te 5 films were locally crystallized by a tightly focused laser beam and the structural evolution was studied by Raman scatting. The marks recorded by a broad range of laser power were studied by optical microscope. Raman spectra of films with irradiation power of 0.1 mW and 1 mW were consistent with those of films annealed at 140°C and 400°C, respectively. It reveals that both the cubic and hexagonal crystalline phases have been achieved under the irradiation of 488 nm laser in...[Show more]
Collections | ANU Research Publications |
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Date published: | 2012 |
Type: | Journal article |
URI: | http://hdl.handle.net/1885/71044 |
Source: | Materials Letters |
DOI: | 10.1016/j.matlet.2012.08.051 |
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