Temperature dependent deformation mechanisms in pure amorphous silicon
High temperature nanoindentation has been performed on pure ion-implanted amorphous silicon (unrelaxed a-Si) and structurally relaxed a-Si to investigate the temperature dependence of mechanical deformation, including pressure-induced phase transformations. Along with the indentation load-depth curves, ex situ measurements such as Raman micro-spectroscopy and cross-sectional transmission electron microscopy analysis on the residual indents reveal the mode of deformation under the indenter....[Show more]
|Collections||ANU Research Publications|
|Source:||Journal of Applied Physics|
|01_Mangalampalli_Temperature_dependent_2014.pdf||3.12 MB||Adobe PDF||Request a copy|
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