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Physical and optical characterisation of Ge-implanted silica

Dowd, A; Llewellyn, David; Elliman, Robert; Luther-Davies, Barry; Samoc, Marek; Fitz Gerald, John

Description

Ge nanocrystals formed in silica by implantation with 1.0 MeV Ge ions and subsequent annealing at 1100°C were characterised by transmission electron microscopy and Raman spectroscopy. The nanocrystals were found to be approximately spherical in shape and

CollectionsANU Research Publications
Date published: 2001
Type: Journal article
URI: http://hdl.handle.net/1885/69801
Source: Nuclear Instruments and Methods in Physics Research: Section B
DOI: 10.1016/S0168-583X(00)00536-X

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