Physical and optical characterisation of Ge-implanted silica
Ge nanocrystals formed in silica by implantation with 1.0 MeV Ge ions and subsequent annealing at 1100°C were characterised by transmission electron microscopy and Raman spectroscopy. The nanocrystals were found to be approximately spherical in shape and
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|Source:||Nuclear Instruments and Methods in Physics Research: Section B|
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