Skip navigation
Skip navigation

Using Bayesian Analysis and Gaussian Processes to Infer Electron Temperature and Density Profiles on the MAST Experiment

von Nessi, G. T.; Hole, M. J.


A unified, Bayesian inference of midplane electron temperature and density profiles using both Thompson scattering (TS) and interferometric data is presented. Beyond the Bayesian nature of the analysis, novel features of the inference are the use of a Gaussian process prior to infer a mollification length-scale of inferred profiles and the use of Gauss-Laguerre quadratures to directly calculate the depolarisation term associated with the TS forward model. Results are presented from an...[Show more]

CollectionsANU Research Publications
Date published: 2013-06-25
Type: Journal article
Source: Review of Scientific Instruments
DOI: 10.1063/1.4811378


File Description SizeFormat Image
01_von Nessi_Using_Bayesian_Analysis_and_2013.pdfPublished Version167.53 kBAdobe PDFThumbnail

Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  20 July 2017/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator