Quantitative electromechanical characterization of materials using conductive ceramic tips
The electromechanical properties of metallic and semiconductor materials are investigated in situ using hard, electrically conductive, vanadium carbide Berkovich tips fitted to a nanoindenter. We demonstrate that, for tip contact radii from 100 nm up to about 1 μm, quantitative electrical data can be successfully obtained from the through-tip resistive measurements simultaneously with mechanical measurements. We outline a procedure for measuring the various resistive components of the...[Show more]
|Collections||ANU Research Publications|
|01_Sprouster_Quantitative_electromechanical_2014.pdf||1.37 MB||Adobe PDF||Request a copy|
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.