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Full tip imaging in atom probe tomography

Du, S.; Burgess, Timothy; Loi, Shyeh Tjing; Gault, B.; Gao, Qiang; Bao, Peite; Li, Li; Cui, Xiangyuan; Yeoh, Wai Kong; Jagadish, Chennupati; Ringer, Simon Peter; Zheng, Rongkun; Tan, Hark Hoe

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Atom probe tomography (APT) is capable of simultaneously revealing the chemical identities and three dimensional positions of individual atoms within a needle-shaped specimen, but suffers from a limited field-of-view (FOV), i.e., only the core of the specimen is effectively detected. Therefore, the capacity to analyze the full tip is crucial and much desired in cases that the shell of the specimen is also the region of interest. In this paper, we demonstrate that, in the analysis of III-V...[Show more]

dc.contributor.authorDu, S.
dc.contributor.authorBurgess, Timothy
dc.contributor.authorLoi, Shyeh Tjing
dc.contributor.authorGault, B.
dc.contributor.authorGao, Qiang
dc.contributor.authorBao, Peite
dc.contributor.authorLi, Li
dc.contributor.authorCui, Xiangyuan
dc.contributor.authorYeoh, Wai Kong
dc.contributor.authorJagadish, Chennupati
dc.contributor.authorRinger, Simon Peter
dc.contributor.authorZheng, Rongkun
dc.contributor.authorTan, Hark Hoe
dc.date.accessioned2015-12-10T23:34:55Z
dc.identifier.issn0304-3991
dc.identifier.urihttp://hdl.handle.net/1885/69636
dc.description.abstractAtom probe tomography (APT) is capable of simultaneously revealing the chemical identities and three dimensional positions of individual atoms within a needle-shaped specimen, but suffers from a limited field-of-view (FOV), i.e., only the core of the specimen is effectively detected. Therefore, the capacity to analyze the full tip is crucial and much desired in cases that the shell of the specimen is also the region of interest. In this paper, we demonstrate that, in the analysis of III-V nanowires epitaxially grown from a substrate, the presence of the flat substrate positioned only micrometers away from the analyzed tip apex alters the field distribution and ion trajectories, which provides extra image compression that allows for the analysis of the entire specimen. An array of experimental results, including field desorption maps, elemental distributions, and crystallographic features clearly demonstrate the fact that the whole tip has been imaged, which is confirmed by electrostatic simulations.
dc.publisherElsevier
dc.sourceUltramicroscopy
dc.subjectKeywords: Atom probe tomography; Chemical identity; Dimensional position; Electrostatic simulations; Elemental distribution; Epitaxially grown; Field distribution; Field of views; Flat substrates; Ion trajectories; Region of interest; Tip apex; Desorption; Image co Atom probe tomography; Full tip imaging; Image compression
dc.titleFull tip imaging in atom probe tomography
dc.typeJournal article
local.description.notesImported from ARIES
local.identifier.citationvolume124
dc.date.issued2013
local.identifier.absfor020500 - OPTICAL PHYSICS
local.identifier.absfor030304 - Physical Chemistry of Materials
local.identifier.absfor030606 - Structural Chemistry and Spectroscopy
local.identifier.ariespublicationf5625xPUB2079
local.identifier.ariespublicationU3594520xPUB587
local.type.statusPublished Version
local.contributor.affiliationDu, S., University of Sydney
local.contributor.affiliationBurgess, Timothy, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationLoi, Shyeh Tjing, University of Sydney
local.contributor.affiliationGault, B., McMaster University
local.contributor.affiliationGao, Qiang, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationBao, Peite, University of Sydney
local.contributor.affiliationLi, Li, University of Sydney
local.contributor.affiliationCui, Xiangyuan, University of Sydney
local.contributor.affiliationYeoh, Wai Kong, University of Sydney
local.contributor.affiliationTan, Hoe Hark, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationJagadish, Chennupati, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationRinger, Simon Peter, University of Sydney
local.contributor.affiliationZheng, Rongkun, University of Sydney
local.description.embargo2037-12-31
local.bibliographicCitation.startpage96
local.bibliographicCitation.lastpage101
local.identifier.doi10.1016/j.ultramic.2012.08.014
local.identifier.absseo970102 - Expanding Knowledge in the Physical Sciences
dc.date.updated2016-02-24T08:53:55Z
local.identifier.scopusID2-s2.0-84868594628
local.identifier.thomsonID000311823700014
CollectionsANU Research Publications

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