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Full tip imaging in atom probe tomography

Du, S.; Burgess, Timothy; Loi, Shyeh Tjing; Gault, B.; Gao, Qiang; Bao, Peite; Li, Li; Cui, Xiangyuan; Yeoh, Wai Kong; Jagadish, Chennupati; Ringer, Simon Peter; Zheng, Rongkun; Tan, Hark Hoe

Description

Atom probe tomography (APT) is capable of simultaneously revealing the chemical identities and three dimensional positions of individual atoms within a needle-shaped specimen, but suffers from a limited field-of-view (FOV), i.e., only the core of the specimen is effectively detected. Therefore, the capacity to analyze the full tip is crucial and much desired in cases that the shell of the specimen is also the region of interest. In this paper, we demonstrate that, in the analysis of III-V...[Show more]

CollectionsANU Research Publications
Date published: 2013
Type: Journal article
URI: http://hdl.handle.net/1885/69636
Source: Ultramicroscopy
DOI: 10.1016/j.ultramic.2012.08.014

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