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Colloid Probe Characterization: Radius and Roughness Determination

Neto, Chiara; Craig, Vincent

Description

In the last 10 years the atomic force microscope (AFM) has routinely been applied to the direct measurement of surface forces. A particle is often attached to the tip of the force-sensing cantilever in order to control the chemistry and the geometry of the interaction. Usually a spherical particle (colloid probe) is employed, and the measured interaction force is normalized by the radius, enabling comparisons to be made with both theory and other techniques. Here we report a simple method for...[Show more]

CollectionsANU Research Publications
Date published: 2001
Type: Journal article
URI: http://hdl.handle.net/1885/69416
Source: Langmuir
DOI: 10.1021/la001506y

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