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Characterization of Semiconductor Nanowires Using Optical Tweezers

Reece, Peter; Toe, Wen Jun; Wang, Fan; Paiman, Suriati; Gao, Qiang; Tan, Hoe Hark; Jagadish, Chennupati

Description

We report on the optical trapping characteristics of InP nanowires with dimensions of 30 (±6) nm in diameter and 2 - 15 μm in length. We describe a method for calibrating the absolute position of individual nanowires relative to the trapping center usin

CollectionsANU Research Publications
Date published: 2011
Type: Journal article
URI: http://hdl.handle.net/1885/69048
Source: Nano Letters
DOI: 10.1021/nl200720m

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