Steinbach, Tobias; Bierschenk, Thomas; Milz, S; Ridgway, Mark C; Wesch, Werner
The influence of high electronic energy deposition in cadmium telluride (CdTe) was investigated using Rutherford backscattering spectrometry in channelling configuration as well as high-resolution transmission electron microscopy. Swift heavy ion irradiation was performed at room temperature with 185 MeV Au ions at perpendicular and non-perpendicular ion incidence. Independent of the ion incidence angle, neither ion beam induced point defects nor amorphous ion tracks were observed along the ion...[Show more]
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