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New perspectives on the bishop tuff from zircon textures, ages and trace elements

Chamberlain, K.J.; Wilson, C.J.N.; Wooden, Joseph L.; Charlier, B L A; Ireland, Trevor


We present zircon textural, trace element and U-Pb age data obtained by secondaryion mass spectrometry (SIMS) (SHRIMPRG: sensitive high-resolution ion microprobe, reverse geometry) from 15 stratigraphically controlled Bishop Tuff samples and two Glass Mountain (GM) lava samples (domes OD and YA). Bishop zircon textures divide into four suites: (a) dominant sector-zoned grains, with (b) subordinate grains showing bright rims [lower U, Th, rare earth elements (REE)] in CL imaging, (c) sparse...[Show more]

CollectionsANU Research Publications
Date published: 2014
Type: Journal article
Source: Journal of Petrology
DOI: 10.1093/petrology/egt072


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