New perspectives on the bishop tuff from zircon textures, ages and trace elements
We present zircon textural, trace element and U-Pb age data obtained by secondaryion mass spectrometry (SIMS) (SHRIMPRG: sensitive high-resolution ion microprobe, reverse geometry) from 15 stratigraphically controlled Bishop Tuff samples and two Glass Mountain (GM) lava samples (domes OD and YA). Bishop zircon textures divide into four suites: (a) dominant sector-zoned grains, with (b) subordinate grains showing bright rims [lower U, Th, rare earth elements (REE)] in CL imaging, (c) sparse...[Show more]
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|Source:||Journal of Petrology|
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