Skip navigation
Skip navigation

Micrometer-Scale Deep-Level Spectral Photoluminescence from Dislocations in Multicrystalline Silicon

Nguyen, Hieu; Rougieux, Fiacre; Wang, Fan; MacDonald, Daniel; Tan, Hark Hoe


Micrometer-scale deep-level spectral photoluminescence (PL) from dislocations is investigated around the subgrain boundaries in multicrystalline silicon. The spatial distribution of the D lines is found to be asymmetrically distributed across the subgrain boundaries, indicating that defects and impurities are decorated almost entirely on one side of the subgrain boundaries. In addition, the D1 and D2 lines are demonstrated to have different origins due to their significantly varying behaviors...[Show more]

CollectionsANU Research Publications
Date published: 2015
Type: Journal article
Source: IEEE Journal of Photovoltaics
DOI: 10.1109/JPHOTOV.2015.2407158


File Description SizeFormat Image
01_Nguyen_Micrometer-Scale_Deep-Level_2015.pdf575.52 kBAdobe PDF    Request a copy

Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  19 May 2020/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator