Chen, Zi-Bin; Lei, Wen; Chen, Bin; Wang, Yan-Bo; Liao, Xiao-Zhou; Tan, Hoe Hark; Zou, Jin; Ringer, Simon Peter; Jagadish, Chennupati
InAs/GaAs(001) quantum dots grown by droplet epitaxy were investigated using electron microscopy. Misfit dislocations in relaxed InAs/GaAs(001) islands were found to be located approximately 2 nm above the crystalline sample surface, which provides an impression that the misfit dislocations did not form at the island/substrate interface. However, detailed microscopy data analysis indicates that the observation is in fact an artefact caused by the surface oxidation of the material that resulted...[Show more]
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