Skip navigation
Skip navigation

Using Managed Runtime Systems to Tolerate Holes in Wearable Memories

Gao, Tiejun; Strauss, Karin; Blackburn, Stephen; McKinley, Kathryn; Burger, Doug; Larus, James

Description

New memory technologies, such as phase-change memory (PCM), promise denser and cheaper main memory, and are expected to displace DRAM. However, many of them experience permanent failures far more quickly than DRAM. DRAM mechanisms that handle permanent fa

CollectionsANU Research Publications
Date published: 2013
Type: Conference paper
URI: http://hdl.handle.net/1885/66262
Source: Proceedings of the ACM SIGPLAN Conference on Programming Language Design and Implementation (PLDI)
DOI: 10.1145/2499370.2462171

Download

File Description SizeFormat Image
01_Gao_Using_Managed_Runtime_Systems_2013.pdf239.07 kBAdobe PDF    Request a copy


Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  20 July 2017/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator