Improvement of resistive switching uniformity by introducing a thin NbOx interface layer
Uniformity is by far an important issue for the application of resistive random access memory (RRAM). In this letter, we explore a prototype RRAM device for switching uniformity improvement. Compared to W/WO3-x/Pt structure, after the introduction of a thin NbOx film between WO 3-x and Pt bottom electrode, the device exhibits much better resistive hysteresis and switching uniformity. The main composition of the interface layer is NbO2 suboxide showing insulator-metal phase transition. A...[Show more]
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|Source:||ECS Solid State Letters|
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