Introduction to X-Ray Absorption Spectroscopy

Abstract

X-ray Absorption Spectroscopy (XAS) is a well-established analytical technique used extensively for the characterization of semiconductors in solid or liquid, crystalline or amorphous, bulk or nanoscale form. With this chapter, we provide a brief introduction to XAS, covering both theory and experiment, while we refer to more comprehensive texts for greater detail about this continually evolving technique. The chapter thus is a starting point upon which subsequent chapters build as they demonstrate the broad-ranging applications of XAS to semiconductors materials.