Skip navigation
Skip navigation

Latent ion tracks in amorphous silicon

Bierschenk, Thomas; Giulian, Raquel; Afra, Boshra; Rodriguez, Matias; Schauries, Daniel; Mudie, Stephen T.; Pakarinen, Olli; Djurabekova, Flyura; Nordlund, Kai; Osmani, O.; Medvedev, Nikita; Rethfeld, B.; Ridgway, Mark C; Kluth, Patrick

Description

We present experimental evidence for the formation of ion tracks in amorphous Si induced by swift heavy-ion irradiation. An underlying core-shell structure consistent with remnants of a high-density liquid structure was revealed by small-angle x-ray scatt

CollectionsANU Research Publications
Date published: 2013
Type: Journal article
URI: http://hdl.handle.net/1885/60724
Source: Physical Review B
DOI: 10.1103/PhysRevB.88.174111

Download

File Description SizeFormat Image
01_Bierschenk_Latent_ion_tracks_in_amorphous_2013.pdf583.5 kBAdobe PDF


Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  20 July 2017/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator