Damage tolerance of Ti 3 SiC 2 to high energy iodine irradiation
The microstructure of high fluence 2 MeV I2+ irradiated Ti3SiC2 has been studied by grazing incident X-ray diffraction (GIXRD) using synchrotron radiation. The shift and broadening of the observed diffraction peaks are due to a variety of defects ranging
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|Source:||Applied Surface Science|
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