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Damage tolerance of Ti 3 SiC 2 to high energy iodine irradiation

Zhang, Lei; Qi, Q.; Shi, L.Q.; O'Connor, D John; King, Bruce Victor; Kisi, Erich Herold; Venkatachalam, Dinesh


The microstructure of high fluence 2 MeV I2+ irradiated Ti3SiC2 has been studied by grazing incident X-ray diffraction (GIXRD) using synchrotron radiation. The shift and broadening of the observed diffraction peaks are due to a variety of defects ranging

CollectionsANU Research Publications
Date published: 2012
Type: Journal article
Source: Applied Surface Science
DOI: 10.1016/j.apsusc.2012.03.022


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