Smith, Leigh M; Jackson, Howard E; Yarrison-Rice, Jan M; Jagadish, Chennupati
With the ability to design and control the physical structure of nanostructures to tune their electronic properties, it is increasingly important to measure the electronic structure of single nanostructures. Here we describe a number of experimental techniques for measuring the electronic structure of single semiconductor nanowires. The advantages, disadvantages and limitations of these methods will be described.
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