Wang, Fan; Lee, Woei Ming; Toe, Wen Jun; Gao, Qiang; Jagadish, Chennupati; Reece, Peter; Tan, Hark Hoe
We report a novel method for using a spatial light modulator (SLM) to spatially map the luminescent properties of single trapped semiconductor nanowires by dynamic optical tweezers. Being able to control the axial position of the trapping focus with respect to the excitation source, the composition along the long axis of the nanowire can be probed. We also explore the feasibility of tailoring trapping beam shape to enhance the axial trap stiffness for long nanowires (> 5 μm).
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