Evolution of Palladium Related Defects in Silicon
The perturbed angular correlation technique is very well suited to characterize the structural, dynamic and electronic properties of impurity or impurity-defect complexes on an atomic scale. Using radioisotope probe 100Pd/100Rh, such measurements have bee
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|Source:||Proceedings of the 57th DAE Solid State Physics Symposium (DAE-SSPS 2012)|
|01_Dogra_Evolution_of_Palladium_Related_2012.pdf||727.92 kB||Adobe PDF||Request a copy|
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