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Evolution of Palladium Related Defects in Silicon

Dogra, R; Sharma, A K; Byrne, Aidan; Ridgway, Mark C

Description

The perturbed angular correlation technique is very well suited to characterize the structural, dynamic and electronic properties of impurity or impurity-defect complexes on an atomic scale. Using radioisotope probe 100Pd/100Rh, such measurements have bee

CollectionsANU Research Publications
Date published: 2012
Type: Conference paper
URI: http://hdl.handle.net/1885/59715
Source: Proceedings of the 57th DAE Solid State Physics Symposium (DAE-SSPS 2012)
DOI: 10.1063/1.4710358

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