Open Research

Degradation of SI-SIO2 interfaces during rapid thermal annealing

dc.contributor.author	Kho, Teng
dc.contributor.author	Black, Lachlan
dc.contributor.author	McIntosh, Keith
dc.coverage.spatial	Hamburg Germany
dc.date.accessioned	2015-12-10T22:42:55Z
dc.date.created	September 21-24 2009
dc.identifier.isbn	3936338256
dc.identifier.uri	http://hdl.handle.net/1885/57993
dc.publisher	WIP-Renewable Energies
dc.relation.ispartofseries	European Photovoltaic Solar Energy Conference 2009
dc.source	Proceedings of the 24th European Photovoltaic Solar Energy Conference
dc.title	Degradation of SI-SIO2 interfaces during rapid thermal annealing
dc.type	Conference paper
local.description.notes	Imported from ARIES
local.description.refereed	Yes
dc.date.issued	2009
local.identifier.absfor	090608 - Renewable Power and Energy Systems Engineering (excl. Solar Cells)
local.identifier.ariespublication	u4334215xPUB423
local.type.status	Published Version
local.contributor.affiliation	Kho, Teng, College of Engineering and Computer Science, ANU
local.contributor.affiliation	Black, Lachlan, College of Engineering and Computer Science, ANU
local.contributor.affiliation	McIntosh, Keith, College of Engineering and Computer Science, ANU
local.description.embargo	2037-12-31
local.bibliographicCitation.startpage	1586
local.bibliographicCitation.lastpage	1590
dc.date.updated	2015-12-09T11:11:12Z
Collections	ANU Research Publications

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