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Impact of carrier profile and rear-side reflection on photoluminescence spectra in planar crystalline silicon wafers at different temperatures

Nguyen, Hieu; Rougieux, Fiacre; Baker-Finch, Simeon; MacDonald, Daniel

Description

The increasing use of spectral photoluminescence as an advanced and accurate diagnostic tool motivates a comprehensive assessment of the effects of some important optical and electrical properties on the photoluminescence spectra from crystalline silicon

CollectionsANU Research Publications
Date published: 2015
Type: Journal article
URI: http://hdl.handle.net/1885/56809
Source: IEEE Journal of Photovoltaics
DOI: 10.1109/JPHOTOV.2014.2359737

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