Xu, Jinbao; Liu, Yun; Withers, Raymond
Multilayered BaTiO3(BTO)/Bi0.5K0.5TiO3 (BKT) thin films have been fabricated on Pt/Ti/SiO2/Si substrates using a metalloorganic decomposition process. XRD investigation of the resultant BTO/BKT multilayered thin films shows that they retain a perovskite-related structure type. They also exhibit a well-defined, polarization-electric field hysteresis loop with a measured remnant polarization (2Pr) of 5 μC/cm2 at an applied electric field of 250 kV/cm. The measured dielectric constant and...[Show more]
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