van Erps, Jurgen; Luan, F; Pelusi, Mark; Iredale, Tim; Madden, Steve; Choi, Duk-Yong; Bulla, Douglas; Luther-Davies, Barry; Thienpont, Hugo; Eggleton, Benjamin J
We present the first demonstration of an optical sampling system, using the optical Kerr effect in a chip-scale device, enabling combined capability for femtosecond resolution and broadband signal wavelength tunability. A temporal resolution <500 fs is achieved using four-wave mixing in a 7-cm-short chalcogenide planar waveguide. The use of a short length, dispersion-shifted waveguide with ultrahigh nonlinearity (104W-1·km-1) enables high-resolution optical sampling without the detrimental...[Show more]
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