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The Potential of the Perturbed Angular Correlation Technique in Characterizing Semiconductors

Dogra, R; Byrne, Aidan; Ridgway, Mark C

Description

Several experimental techniques are available to investigate materials but microscopic techniques based on hyperfine interaction form a subclass that can characterize materials at the smallest possible atomic scale. The interaction of the nuclear electromagnetic moments with the hyperfine fields arising from the extranuclear electronic charges and spin distributions forms the basis of hyperfine methods. In this review article, one of the hyperfine methods, known as perturbed angular correlation...[Show more]

CollectionsANU Research Publications
Date published: 2009
Type: Journal article
URI: http://hdl.handle.net/1885/55491
Source: Journal of Electronic Materials
DOI: 10.1007/s11664-009-0658-x

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