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Broadening of vibrational levels in X-ray absorption spectroscopy of molecular nitrogen in compound semiconductors

Petravic, Mladen; Gao, Qiang; Llewellyn, David; Deenapanray, Prakash; MacDonald, Daniel; Crotti, C

Description

We have used high-resolution near-edge X-ray absorption fine structure spectroscopy to study the N 1s → 1π* resonance of N2 trapped below the surface of several compound semiconductors. The vibrational fine structure, observed from all samples under co

CollectionsANU Research Publications
Date published: 2006
Type: Journal article
URI: http://hdl.handle.net/1885/54598
Source: Chemical Physics Letters
DOI: 10.1016/j.cplett.2006.05.056

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