Probing the Indium Nitride Lattice Locally with the Radioisotope Probe 111In/Cd
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Timmers, Heiko; Dogra, Rakesh; Shrestha, Santosh K; Edge, A. Vernon; Byrne, Aidan
Description
The lattice structure of both InN grains with submicron dimensions and a MBE-grown InN film have been studied with the radioisotope probe 111in/Cd and Perturbed Angular Correlation spectroscopy. The quadrupole interaction frequency of the probe in this material has been measured to be of the order of 28 MHz, consistent with results for ALN and GaN. Strong damping of the signal indicates that InN has a highly defective lattice with diverse defect structures, which are not cured by annealing in...[Show more]
dc.contributor.author | Timmers, Heiko | |
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dc.contributor.author | Dogra, Rakesh | |
dc.contributor.author | Shrestha, Santosh K | |
dc.contributor.author | Edge, A. Vernon | |
dc.contributor.author | Byrne, Aidan | |
dc.coverage.spatial | Brisbane Australia | |
dc.date.accessioned | 2015-12-10T22:27:48Z | |
dc.date.available | 2015-12-10T22:27:48Z | |
dc.date.created | December 8 2004 | |
dc.identifier.isbn | 1097-2137 | |
dc.identifier.uri | http://hdl.handle.net/1885/54368 | |
dc.description.abstract | The lattice structure of both InN grains with submicron dimensions and a MBE-grown InN film have been studied with the radioisotope probe 111in/Cd and Perturbed Angular Correlation spectroscopy. The quadrupole interaction frequency of the probe in this material has been measured to be of the order of 28 MHz, consistent with results for ALN and GaN. Strong damping of the signal indicates that InN has a highly defective lattice with diverse defect structures, which are not cured by annealing in the accessible temperature range. | |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE Inc) | |
dc.relation.ispartofseries | Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2004) | |
dc.source | 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings | |
dc.subject | Keywords: Nuclear engineering; Radioactive materials; Indium nitride (InN); Lattice (CO); Lattice structures; Microelectronic materials; sub micron dimensions; Radioisotopes Annealing; In/Cd; InN; MBE growth; Nanowires; PAC; Radioisotope probe | |
dc.title | Probing the Indium Nitride Lattice Locally with the Radioisotope Probe 111In/Cd | |
dc.type | Conference paper | |
local.description.notes | Imported from ARIES | |
local.description.refereed | Yes | |
dc.date.issued | 2005 | |
local.identifier.absfor | 020406 - Surfaces and Structural Properties of Condensed Matter | |
local.identifier.ariespublication | MigratedxPub299 | |
local.type.status | Published Version | |
local.contributor.affiliation | Timmers, Heiko, University of New South Wales, ADFA | |
local.contributor.affiliation | Dogra, Rakesh, College of Physical and Mathematical Sciences, ANU | |
local.contributor.affiliation | Shrestha, Santosh K, University of New South Wales, ADFA | |
local.contributor.affiliation | Edge, A. Vernon, University of New South Wales, ADFA | |
local.contributor.affiliation | Byrne, Aidan, College of Physical and Mathematical Sciences, ANU | |
local.bibliographicCitation.startpage | 17 | |
local.bibliographicCitation.lastpage | 20 | |
local.identifier.doi | 10.1109/COMMAD.2004.1577481 | |
dc.date.updated | 2015-12-09T09:43:54Z | |
local.identifier.scopusID | 2-s2.0-46149087058 | |
Collections | ANU Research Publications |
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