Sueda, Yuichiro; Irifune, Tetsuo; Norimasa, Nishiyama; Rapp, Robert; Ferroir, Tristan; Onozawa, Tsuyoshi; Yagi, Takehiko; Markel, Sebastien; Miyajima, Nobuyoshi; Funakoshi, K
In situ X-ray diffraction measurements have been made on KAlSi3O8 hollandite using diamond anvil cell and multianvil apparatus combined with synchrotron radiation. Both of the measurements with different techniques demonstrated that K-hollandite transforms to a new high-pressure phase (hollandite II) at ∼22 GPa upon increasing pressure at room temperature. The X-ray diffraction peaks of the new phase were reasonably indexed on the basis of a monoclinic cell with I2/m space group. Hollandite II...[Show more]
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