Photoluminescence and charge storage characteristics of silica nanocrystals: The role of stress-induced interface defects
SiO2 nanocrystals embedded in Lu2O3 thin film were fabricated using pulsed-laser deposition method. Two dimensional finite element calculations clearly reveal that SiO2 nanocrystals certainly experienced great compressive stress in Lu2O3 thin film. This may lead to a great deal of stress-induced defects at the interface of SiO2 nanocrystals embedded in Lu2O3 thin film and thus induced the observed photoluminescence peak and charge storage properties. The findings presented here indicate that...[Show more]
|Collections||ANU Research Publications|
|Source:||Applied Surface Science|
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