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Resistance switching in polycrystalline NiOx thin film

Kim, Tae-Hyun; Nawaz (Saleh), Muhammad; Kim, Sung-I; Venkatachalam, Dinesh; Belay, Kidane; Burgess, Andrew; Strumpp, Stephan; Elliman, Robert

Description

Resistive switching properties of polycrystalline NiOx dielectric films are investigated utilizing thermo-chemical model in which a field-induced conductive filament is formed and broken by joule heating.

CollectionsANU Research Publications
Date published: 2010
Type: Conference paper
URI: http://hdl.handle.net/1885/51745
Source: 2010 conference on Optoelectronic and Microelectronic Materials and Devices Proceedings
DOI: 10.1109/COMMAD.2010.5699751

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