Bistable Resistive Switching in Hafnium-Silicate Thin Films
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Nawaz (Saleh), Muhammad; Venkatachalam, Dinesh; Belay, Kidane; Kim, Tae-Hyun; Elliman, Robert
Description
We report on the resistive switching mechanism of dc magnetron sputtered hafnium-silicates (HfxSi1-xO2) memory thin films. It is observed that the electroforming of these films depends on the thickness and stoichiometry of the insulator as well as on the
| Collections | ANU Research Publications |
|---|---|
| Date published: | 2010 |
| Type: | Conference paper |
| URI: | http://hdl.handle.net/1885/51566 |
| Source: | 2010 conference on Optoelectronic and Microelectronic Materials and Devices Proceedings |
| DOI: | 10.1109/COMMAD.2010.5699730 |
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| File | Description | Size | Format | Image |
|---|---|---|---|---|
| 01_Nawaz (Saleh)_Bistable_Resistive_Switching_2010.pdf | 879.82 kB | Adobe PDF | Request a copy |
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