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Roughness of Microspheres for Force Measurements

van Zwol, P J; Palasantzas, G; van de Schootbrugge, M; de Hosson, J. Th. M; Craig, Vincent

Description

We have investigated the morphology and surface roughness of several commercially available microspheres to determine their suitability for force measurements using the atomic force microscope. The roughness varies considerably, depending on sphere size and material, ranging from nearly ideally flat up to micrometer-sized features. Because surface roughness significantly influences the magnitude and accuracy of measurement of surface forces, the results presented here should be helpful for...[Show more]

CollectionsANU Research Publications
Date published: 2008
Type: Journal article
URI: http://hdl.handle.net/1885/50324
Source: Langmuir
DOI: 10.1021/la800664f

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