Skip navigation
Skip navigation

Roughness of Microspheres for Force Measurements

van Zwol, P J; Palasantzas, G; van de Schootbrugge, M; de Hosson, J. Th. M; Craig, Vincent


We have investigated the morphology and surface roughness of several commercially available microspheres to determine their suitability for force measurements using the atomic force microscope. The roughness varies considerably, depending on sphere size and material, ranging from nearly ideally flat up to micrometer-sized features. Because surface roughness significantly influences the magnitude and accuracy of measurement of surface forces, the results presented here should be helpful for...[Show more]

CollectionsANU Research Publications
Date published: 2008
Type: Journal article
Source: Langmuir
DOI: 10.1021/la800664f


File Description SizeFormat Image
01_van Zwol_Roughness_of_Microspheres_for_2008.pdf1.45 MBAdobe PDFThumbnail

Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  19 May 2020/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator