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Self-assembled growth and luminescence of crystalline Si/SiO x core-shell nanowires

Kim, Sung; Kim, Chang Oh; Shin, D H; Hong , Seung Hui; Kim, Min Choul; Kim, Joon; Choi, Suk Ho; Kim, Tae-Hyun; Elliman, Robert; Kim, Young-Min

Description

Crystalline Si/SiOx core/shell nanowires(NWs) are self-assembled by annealing Ni-coated hydrogenated Si-rich SiOx (SRO:H) films at 1100 °C in the presence of Si powder. Plasma-enhanced chemical vapor deposition is used to grow 100nm SRO:H thin films with

dc.contributor.authorKim, Sung
dc.contributor.authorKim, Chang Oh
dc.contributor.authorShin, D H
dc.contributor.authorHong , Seung Hui
dc.contributor.authorKim, Min Choul
dc.contributor.authorKim, Joon
dc.contributor.authorChoi, Suk Ho
dc.contributor.authorKim, Tae-Hyun
dc.contributor.authorElliman, Robert
dc.contributor.authorKim, Young-Min
dc.date.accessioned2015-12-10T22:12:12Z
dc.date.available2015-12-10T22:12:12Z
dc.identifier.issn0957-4484
dc.identifier.urihttp://hdl.handle.net/1885/49535
dc.description.abstractCrystalline Si/SiOx core/shell nanowires(NWs) are self-assembled by annealing Ni-coated hydrogenated Si-rich SiOx (SRO:H) films at 1100 °C in the presence of Si powder. Plasma-enhanced chemical vapor deposition is used to grow 100nm SRO:H thin films with
dc.publisherInstitute of Physics Publishing
dc.sourceNanotechnology
dc.subjectKeywords: [A] Growth models; Average diameter; Core-shell nanowires; Core/shell; Core/shell structure; Defect state; Emission bands; Growth process; Photoluminescence spectrum; PL bands; Self-assembled; Self-assembled growth; Shell interface; Si concentration; Sili
dc.titleSelf-assembled growth and luminescence of crystalline Si/SiO x core-shell nanowires
dc.typeJournal article
local.description.notesImported from ARIES
local.identifier.citationvolume21
dc.date.issued2010
local.identifier.absfor020499 - Condensed Matter Physics not elsewhere classified
local.identifier.ariespublicationf2965xPUB188
local.type.statusPublished Version
local.contributor.affiliationKim, Sung, Kyung Hee University
local.contributor.affiliationKim, Chang Oh, Kyung Hee University
local.contributor.affiliationShin, D H, Kyung Hee University
local.contributor.affiliationHong , Seung Hui, Kyung Hee University
local.contributor.affiliationKim, Min Choul, Kyung Hee University
local.contributor.affiliationKim, Joon, Korea University
local.contributor.affiliationChoi, Suk Ho, Kyung Hee University
local.contributor.affiliationKim, Tae-Hyun, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationElliman, Robert, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationKim, Young-Min, Korea Basic Science Institute
local.bibliographicCitation.issue20
local.bibliographicCitation.startpage1
local.bibliographicCitation.lastpage7
local.identifier.doi10.1088/0957-4484/21/20/205601
dc.date.updated2016-02-24T08:19:00Z
local.identifier.scopusID2-s2.0-77951576414
local.identifier.thomsonID000277214900014
CollectionsANU Research Publications

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