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Melting Kinetics of Confined Systems at the Nanoscale: Superheating and Supercooling

Sharp, I D; Xu, Q; Yuan, C W; Yi, D O; Liao, C Y; Glaeser, Andreas M; Minor, A M; Beeman, J W; Ridgway, Mark C; Kluth, Patrick; Ager, J W; Chrzan, D C; Haller, E E

Description

In situ electron diffraction measurements of silica-embedded Ge nanocrystals reveal a melting/solidification hysteresis of 470 K which is approximately symmetric about the bulk melting point. This surprising behavior, which is thought to be impossible in

CollectionsANU Research Publications
Date published: 2007
Type: Conference paper
URI: http://hdl.handle.net/1885/49482
Source: Proceedings of International Conference on the Physics of Semiconductors (ICPS 2006)
DOI: 10.1063/1.2729834

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