Formation and Characterization of Aluminium Contacts to n-type Silicon
Download (25.98 MB)
-
Altmetric Citations
Description
Samples were prepared by performing phosphorus diffusions with POCl3 on Sb doped (100) silicon wafers. 99.9% (3N) purity Al or 99.999% (5N) purity Al dots of diameter 0.7 mm and thickness between 0.2 µm or 1.0 µm were then deposited onto quarters of these wafers. The quarters were then subsequently cleaved into 1 cm2 pieces which were annealed at temperatures ranging from 400?C to 650?C for durations of time between 10 minutes and 2 hours. The speed with which these samples were cooled was also...[Show more]
Collections | Open Access Theses |
---|---|
Date published: | 2004 |
Type: | Thesis (Honours) |
URI: | http://hdl.handle.net/1885/42653 |
DOI: | 10.25911/5d7a291c6a3e6 |
Download
File | Description | Size | Format | Image |
---|---|---|---|---|
Weinholz_Thesis.pdf | 25.98 MB | Adobe PDF | ![]() | |
2913-~$A.XSH | 360 B | Unknown |
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.
Updated: 19 May 2020/ Responsible Officer: University Librarian/ Page Contact: Library Systems & Web Coordinator