Recombination and trapping in multicrystalline silicon
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Cuevas, Andres; Stocks, Matthew; Macdonald, D; Kerr, Mark John; Samundsett, C
Description
Minority carrier recombination and trapping frequently coexist in multicrystalline silicon (mc-Si), with the latter effect obscuring both transient and steady-state measurements of the photoconductance. In this paper, the injection dependence of the measured lifetime is studied to gain insight into these physical mechanisms. A theoretical model for minority carrier trapping is shown to explain the anomalous dependence of the apparent lifetime with injection level and allow the evaluation of the...[Show more]
Collections | ANU Research Publications |
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Date published: | 1999 |
Type: | Journal article |
URI: | http://hdl.handle.net/1885/40865 http://digitalcollections.anu.edu.au/handle/1885/40865 |
Source: | IEEE Transactions on Electron Devices |
DOI: | 10.1109/16.791992 |
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