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Recombination and trapping in multicrystalline silicon

Cuevas, Andres; Stocks, Matthew; Macdonald, D; Kerr, Mark John; Samundsett, C


Minority carrier recombination and trapping frequently coexist in multicrystalline silicon (mc-Si), with the latter effect obscuring both transient and steady-state measurements of the photoconductance. In this paper, the injection dependence of the measured lifetime is studied to gain insight into these physical mechanisms. A theoretical model for minority carrier trapping is shown to explain the anomalous dependence of the apparent lifetime with injection level and allow the evaluation of the...[Show more]

CollectionsANU Research Publications
Date published: 1999
Type: Journal article
Source: IEEE Transactions on Electron Devices
DOI: 10.1109/16.791992


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