Defective crystal recovered from the crystallisation of potassium doped amorphous silicon films
The quality of a crystallized potassium-doped amorphous silicon film was investigated using transmission electron microscopy. It was discovered that the planar epitaxial growth of the amorphous layer was upset after a certain concentration of potassium was encountered by the interface. The crystal recovered subsequent to this point was twinned. The twins lie on $111% planes. The results from the transmission electron microscope analyses were correlated with the rate of solid-phase epitaxy as...[Show more]
|Collections||ANU Research Publications|
|2348-01.2004-01-07T04:18:23Z.xsh||354 B||EPrints MD5 Hash XML|
|JEC150Liu.pdf||563.17 kB||Adobe PDF|
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.