Liu, A. C. Y; McCallum, Jeffrey C; Deenapanray, P. N. K
The quality of a crystallized potassium-doped amorphous silicon film was investigated using transmission electron microscopy. It was discovered that the planar epitaxial growth of the amorphous layer was upset after a certain concentration of potassium was encountered by the interface. The crystal recovered subsequent to this point was twinned. The twins lie on $111% planes. The results from the transmission electron microscope analyses were correlated with the rate of solid-phase epitaxy as...[Show more]
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