Rutherford backscattering using electrons as projectiles: Underlying principles and possible applications
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Description
Ion beam analysis is the method of choice for studying the composition of layers with a thickness exceeding several tens of Å. Recently it has become clear that elastic scattering of keV electrons can be used to determine the surface composition of relat
| Collections | ANU Research Publications |
|---|---|
| Date published: | 2008 |
| Type: | Journal article |
| URI: | http://hdl.handle.net/1885/39897 |
| Source: | Nuclear Instruments and Methods in Physics Research: Section B |
| DOI: | 10.1016/j.nimb.2008.01.059 |
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| File | Description | Size | Format | Image |
|---|---|---|---|---|
| 01_Went_Rutherford_backscattering_2008.pdf | 587.46 kB | Adobe PDF | Request a copy |
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