Structural characterization of pressure-induced amorphous silicon
We investigate the structure and mechanical properties of pressure-induced (PI) amorphous silicon (a-Si) and compare this to the more extensively characterized case of a-Si created by ion implantation. To study the effect of thermal history we also examine the structure of both PI and ion-implanted a-Si after a low-temperature "relaxation" anneal (450°C). Indentation testing suggests that structural changes are induced by thermal annealing. As-prepared forms of a-Si deform via plastic flow,...[Show more]
|Collections||ANU Research Publications|
|Source:||Physical Review B: Condensed Matter and Materials|
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