Skip navigation
Skip navigation

Structural characterization of pressure-induced amorphous silicon

Haberl, Bianca; Liu, A. C. Y.; Bradby, Jodie; Ruffell, Simon; Williams, James; Munroe, Paul


We investigate the structure and mechanical properties of pressure-induced (PI) amorphous silicon (a-Si) and compare this to the more extensively characterized case of a-Si created by ion implantation. To study the effect of thermal history we also examine the structure of both PI and ion-implanted a-Si after a low-temperature "relaxation" anneal (450°C). Indentation testing suggests that structural changes are induced by thermal annealing. As-prepared forms of a-Si deform via plastic flow,...[Show more]

CollectionsANU Research Publications
Date published: 2009
Type: Journal article
Source: Physical Review B: Condensed Matter and Materials
DOI: 10.1103/PhysRevB.79.155209


There are no files associated with this item.

Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  19 May 2020/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator