Surface Modifications by Swift Heavy-Ion Irradiation of Indium Phosphide
InP (001) samples were irradiated with 200 MeV Au ions at different fluences. The surface nanotopographical changes due to increasing fluence of swift heavy ions were observed by Atomic Force Microscopy (AFM), where the onset of a large increase in surface roughness for fluences sufficient to cause complete surface amorphization was observed. Transmission Electron Microscopy (TEM) was used to observe bulk-ion tracks that formed in InP, and high resolution TEM (HRTEM) revealed that single-ion...[Show more]
|Collections||ANU Research Publications|
|Source:||Physics of Particles and Nuclei|
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