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Surface Modifications by Swift Heavy-Ion Irradiation of Indium Phosphide

Khalil, Ali S; Chadderton, Lewis; Didyk, A Y; Ridgway, Mark C; Stewart, Andrew

Description

InP (001) samples were irradiated with 200 MeV Au ions at different fluences. The surface nanotopographical changes due to increasing fluence of swift heavy ions were observed by Atomic Force Microscopy (AFM), where the onset of a large increase in surface roughness for fluences sufficient to cause complete surface amorphization was observed. Transmission Electron Microscopy (TEM) was used to observe bulk-ion tracks that formed in InP, and high resolution TEM (HRTEM) revealed that single-ion...[Show more]

CollectionsANU Research Publications
Date published: 2008
Type: Journal article
URI: http://hdl.handle.net/1885/38679
Source: Physics of Particles and Nuclei
DOI: 10.1134/S1547477108050130

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