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Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscattering

Vos, Maarten; Went, Michael


We demonstrate that high-energy, high-resolution reflection electron energy loss spectroscopy can provide unique insights into interface formation, especially for the case where an extended interface is formed. By changing the geometry and/or electron energy the electronic structure can be probed over a range of thicknesses (from 10s of Å to more than 1000 Å). At the same time one resolves the elastically scattered electrons into different components, corresponding to scattering of atoms with...[Show more]

CollectionsANU Research Publications
Date published: 2007
Type: Journal article
Source: Surface Science
DOI: 10.1016/j.susc.2007.07.031


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