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Experimental confirmation of the EPES sampling depth paradox for overlayer/substrate systems

Vos, Maarten; Went, Michael

Description

Elastic-peak electron spectroscopy (EPES) has been one of the main tools for obtaining the inelastic mean free path of electrons in solids. Recently it has become clear that, if this type of experiment is done using an energetic electron beam (20-40 keV)

CollectionsANU Research Publications
Date published: 2007
Type: Journal article
URI: http://hdl.handle.net/1885/37771
Source: Surface Science
DOI: 10.1016/j.susc.2007.01.014

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