Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering
Kluth, Patrick; Schnohr, Claudia; Sprouster, David; Byrne, Aidan; Cookson, D J; Ridgway, Mark C
Description
In this paper we present preliminary yet promising results on the measurement of latent ion tracks in amorphous, 2 μm thick SiO2 layers using small angle X-ray scattering (SAXS). The tracks were generated by ion irradiation with 89 MeV Au ions to fluence
| Collections | ANU Research Publications |
|---|---|
| Date published: | 2008 |
| Type: | Journal article |
| URI: | http://hdl.handle.net/1885/36808 |
| Source: | Nuclear Instruments and Methods in Physics Research: Section B |
| DOI: | 10.1016/j.nimb.2008.03.182 |
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