Skip navigation
Skip navigation

Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering

link to publisher version

  • Altmetric Citations

Kluth, Patrick; Schnohr, Claudia; Sprouster, David; Byrne, Aidan; Cookson, D J; Ridgway, Mark C

Description

In this paper we present preliminary yet promising results on the measurement of latent ion tracks in amorphous, 2 μm thick SiO2 layers using small angle X-ray scattering (SAXS). The tracks were generated by ion irradiation with 89 MeV Au ions to fluence

CollectionsANU Research Publications
Date published: 2008
Type: Journal article
URI: http://hdl.handle.net/1885/36808
Source: Nuclear Instruments and Methods in Physics Research: Section B
DOI: 10.1016/j.nimb.2008.03.182

Download

There are no files associated with this item.
Show full item record


Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  17 November 2022/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator